Beta limit of resistive plasma in a heliotron
Author(s) -
K. Itoh,
K. Ichiguchi,
S.I. Itoh
Publication year - 1992
Publication title -
physics of fluids b plasma physics
Language(s) - English
Resource type - Journals
eISSN - 2163-503X
pISSN - 0899-8221
DOI - 10.1063/1.860132
Subject(s) - thermal diffusivity , beta (programming language) , plasma , resistive touchscreen , mode (computer interface) , electrical resistivity and conductivity , limit (mathematics) , current (fluid) , viscosity , physics , stability (learning theory) , ion , materials science , mechanics , atomic physics , computational physics , condensed matter physics , thermodynamics , nuclear physics , mathematics , mathematical analysis , electrical engineering , computer science , programming language , quantum mechanics , machine learning , engineering , operating system
"Stability against the interchange mode in heliotron devices is investigated, taking into account the effects of the resistivity, current diffusivity, ion viscosity, and thermal diffusivity. Critical beta for the low‐mode‐number stability is found at the finite beta value. For the range of plasma parameters of the present experiments, the resistive mode and current diffusive mode set comparable critical beta values, which are consistent with experimental observations. In future high‐temperature plasmas, the current‐diffusive mode could be important in determining the stability limit for the global mode.
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