Open AccessGhost imaging second harmonic generation microscopy
Author(s) -
Xiewen Wen,
Sushovit Adhikari,
Cristian L. Cortes,
David J. Gosztola,
Stephen K. Gray,
Gary P. Wiederrecht
Publication year - 2020
Publication title -
applied physics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.5144690
Subject(s) - raster scan , raster graphics , optics , microscopy , second harmonic generation , second harmonic imaging microscopy , sampling (signal processing) , compressed sensing , materials science , image quality , computer science , sample (material) , scattering , physics , artificial intelligence , image (mathematics) , detector , laser , thermodynamics