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Direct detection of rare earth ion distributions in gallium nitride and its influence on growth morphology
Author(s) -
Brandon Mitchell,
Dolf Timmerman,
Wanxin Zhu,
J. Y. Lin,
H. X. Jiang,
Jonathan D. Poplawsky,
Ryota Ishii,
Yoichi Kawakami,
Volkmar Dierolf,
Jun Tatebayashi,
Shuhei Ichikawa,
Y. Fujiwara
Publication year - 2020
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.5134050
Subject(s) - materials science , doping , atom probe , dopant , photoluminescence , gallium nitride , transmission electron microscopy , gallium , crystallography , analytical chemistry (journal) , optoelectronics , nanotechnology , chemistry , layer (electronics) , chromatography , metallurgy

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