Open AccessInferred UV fluence focal-spot profiles from soft x-ray pinhole-camera measurements on OMEGA
Author(s) -
W. Theobald,
C. Sorce,
William R. Donaldson,
R. Epstein,
R. L. Keck,
Carol K. Kellogg,
T. J. Kessler,
J. Kwiatkowski,
F. J. Marshall,
Siddharth Sampat,
W. Seka,
Rahul Shah,
A. Shvydky,
C. Stöeckl,
L. J. Waxer,
S. P. Regan
Publication year - 2020
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.5120708
Subject(s) - fluence , pinhole camera , optics , pinhole (optics) , laser , materials science , physics , foil method , irradiation , detector , nuclear physics , composite material
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