Open AccessIon-induced electron emission reduction via complex surface trapping
Author(s) -
Cesar E. Huerta,
Richard E. Wirz
Publication year - 2019
Publication title -
aip advances
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5120519
Subject(s) - tungsten , trapping , ion , electron , materials science , yield (engineering) , plasma , monte carlo method , molecular physics , atomic physics , surface (topology) , reduction (mathematics) , scanning electron microscope , computational physics , geometry , chemistry , physics , composite material , ecology , statistics , mathematics , organic chemistry , quantum mechanics , metallurgy , biology
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