Open AccessA rapid technique for the determination of secondary electron emission yield from complex surfaces
Author(s) -
Angelica Ottaviano,
Sankha Banerjee,
Yevgeny Raitses
Publication year - 2019
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.5114836
Subject(s) - secondary electrons , secondary emission , yield (engineering) , electron , scanning electron microscope , plasma , materials science , carbon fibers , chemistry , analytical chemistry (journal) , atomic physics , composite material , physics , chromatography , quantum mechanics , composite number