Open AccessSpectroscopic ellipsometry extraction of optical constants for materials from oxide covered samples: Application to the plutonium/oxides system
Author(s) -
L. N. Dinh,
Jeff A. Stanford,
C. K. Saw,
A. J. Nelson,
R. Gollott,
J.M. Haschke,
P. G. Allen,
Christopher S. Gardner,
C A Hrousis,
W. J. Siekhaus,
William McLean
Publication year - 2019
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.5092129
Subject(s) - ellipsometry , oxide , materials science , plutonium , analytical chemistry (journal) , refractive index , substrate (aquarium) , metal , phase (matter) , wavelength , thin film , chemistry , optoelectronics , nuclear chemistry , metallurgy , nanotechnology , oceanography , organic chemistry , chromatography , geology
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