Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance | Zendy

Omur E. Dagdeviren | Zendy; Udo D. Schwarz | Zendy

Open Access

Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance

Author(s) -

Omur E. Dagdeviren,

Udo D. Schwarz

Publication year - 2019

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.5089634

Subject(s) - oscillation (cell signaling) , amplitude , cantilever , characterization (materials science) , sample (material) , divergence (linguistics) , non contact atomic force microscopy , materials science , resolution (logic) , atomic force microscopy , conductive atomic force microscopy , optics , computational physics , physics , nanotechnology , chemistry , computer science , composite material , thermodynamics , biochemistry , linguistics , philosophy , artificial intelligence

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