Open AccessImage-plate sensitivity to x rays at 2 to 60 keV
Author(s) -
M. J. Rosenberg,
D. B. Thorn,
N. Izumi,
David R. Williams,
Mark Rowland,
G. Torres,
M. J. Haugh,
Patrick Hillyard,
N. T. Adelman,
Thomas V. Schuler,
M. A. Barrios,
J. P. Holder,
M. B. Schneider,
K. B. Fournier,
D. K. Bradley,
S. P. Regan
Publication year - 2019
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.5053592
Subject(s) - scanner , sensitivity (control systems) , spectrometer , physics , optics , national ignition facility , calibration , pixel , energy (signal processing) , range (aeronautics) , materials science , laser , inertial confinement fusion , quantum mechanics , electronic engineering , engineering , composite material
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