Open AccessThe qPlus sensor, a powerful core for the atomic force microscope
Author(s) -
Franz J. Gießibl
Publication year - 2019
Publication title -
review of scientific instruments online/review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.5052264
Subject(s) - cantilever , conductive atomic force microscopy , force spectroscopy , nanotechnology , scanning tunneling microscope , tuning fork , non contact atomic force microscopy , materials science , atomic force microscopy , subatomic particle , chemical force microscopy , scanning probe microscopy , optoelectronics , physics , vibration , acoustics , composite material , elementary particle , nuclear physics