Open AccessThe qPlus sensor, a powerful core for the atomic force microscope
Author(s) -
Franz J. Gießibl
Publication year - 2019
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.5052264
Subject(s) - cantilever , conductive atomic force microscopy , force spectroscopy , nanotechnology , scanning tunneling microscope , non contact atomic force microscopy , tuning fork , materials science , atomic force microscopy , chemical force microscopy , scanning probe microscopy , subatomic particle , optoelectronics , physics , vibration , acoustics , elementary particle , nuclear physics , composite material
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