Open AccessScanning microwave imaging of optically patterned Ge2Sb2Te5
Author(s) -
Scott R. Johnston,
Edwin Ng,
Scott W. Fong,
Walter Mok,
Jeongwon Park,
Peter Zalden,
Anne Sakdinawat,
H.S. Philip Wong,
Hideo Mabuchi,
ZhiXun Shen
Publication year - 2019
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.5052018
Subject(s) - materials science , amorphous solid , crystallization , nanoscopic scale , characterization (materials science) , optoelectronics , microwave , microscopy , optics , thin film , conductivity , nanotechnology , crystallography , chemistry , physics , organic chemistry , quantum mechanics
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