Crystallographic orientation of uniaxial calcite and dolomite determined using reflection generalized ellipsometry
Author(s) -
Gerald E. Jellison,
Donovan N. Leonard,
Lawrence M. Anovitz,
Chad M. Parish,
E. D. Specht,
Thomas M. Rosseel
Publication year - 2018
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.5048724
Subject(s) - optical axis , birefringence , ellipsometry , optics , materials science , uniaxial crystal , refractive index , reflection (computer programming) , tilt (camera) , electron backscatter diffraction , distortion (music) , angle of incidence (optics) , dolomite , polarimeter , pole figure , diffraction , polarimetry , lens (geology) , scattering , geometry , physics , optoelectronics , thin film , mathematics , programming language , computer science , nanotechnology , amplifier , cmos , metallurgy
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