Open AccessOne-minute nano-tomography using hard X-ray full-field transmission microscope
Author(s) -
Mingyuan Ge,
David Scott Coburn,
Evgeny Nazaretski,
Weihe Xu,
K. Gofron,
Huijuan Xu,
Zhijian Yin,
Ivan Lee
Publication year - 2018
Publication title -
applied physics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.5048378
Subject(s) - beamline , synchrotron , image resolution , optics , resolution (logic) , microscope , tomography , microscopy , x ray , synchrotron radiation , national laboratory , materials science , physics , computer science , beam (structure) , engineering physics , artificial intelligence
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