Open AccessOne-minute nano-tomography using hard X-ray full-field transmission microscope
Author(s) -
Mingyuan Ge,
D. S. Coburn,
Evgeny Nazaretski,
Weihe Xu,
K. Gofron,
Haiping Xu,
Zhijian Yin,
Ivan Lee
Publication year - 2018
Publication title -
applied physics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.5048378
Subject(s) - beamline , synchrotron , image resolution , optics , resolution (logic) , microscopy , tomography , x ray , microscope , national laboratory , physics , synchrotron radiation , materials science , medical physics , computer science , beam (structure) , engineering physics , artificial intelligence