Open AccessImplementing time resolved electron temperature capability at the NIF using a streak camera
Author(s) -
S. F. Khan,
L. C. Jarrott,
P. K. Patel,
N. Izumi,
T. Ma,
A. G. MacPhee,
B. Hatch,
O. L. Landen,
James Heinmiller,
J. D. Kilkenny,
D. K. Bradley
Publication year - 2018
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.5039382
Subject(s) - streak camera , streak , materials science , electron , electron temperature , optics , physics , nuclear physics , laser
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