Open AccessNote: Narrow x-ray reflections are easier to locate with sandpaper
Author(s) -
N. R. Pereira,
Albert T. Macrander
Publication year - 2018
Publication title -
review of scientific instruments online/review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.5019463
Subject(s) - sandpaper , monochromatic color , optics , reflection (computer programming) , soft x rays , physics , x ray , materials science , computer science , laser , metallurgy , programming language