
Structural and electrical properties of single crystalline SrZrO3 epitaxially grown on Ge (001)
Author(s) -
Zheng Hui Lim,
Kamyar Ahmadi-Majlan,
Everett D. Grimley,
Y. Du,
Mark E. Bowden,
Reza Moghadam,
James M. LeBeau,
Scott A. Chambers,
J. H. Ngai
Publication year - 2017
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.5000142
Subject(s) - molecular beam epitaxy , epitaxy , materials science , annealing (glass) , fermi level , photoemission spectroscopy , optoelectronics , condensed matter physics , analytical chemistry (journal) , x ray photoelectron spectroscopy , chemistry , nanotechnology , nuclear magnetic resonance , electron , physics , layer (electronics) , quantum mechanics , chromatography , composite material