Structural and electrical properties of single crystalline SrZrO3 epitaxially grown on Ge (001)
Author(s) -
Zheng Hui Lim,
Kamyar AhmadiMajlan,
Everett D. Grimley,
Yingge Du,
Mark Bowden,
Reza Moghadam,
James M. LeBeau,
Scott A. Chambers,
Joseph H. Ngai
Publication year - 2017
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.5000142
Subject(s) - molecular beam epitaxy , epitaxy , materials science , optoelectronics , annealing (glass) , photoemission spectroscopy , fermi level , condensed matter physics , x ray photoelectron spectroscopy , nanotechnology , nuclear magnetic resonance , electron , layer (electronics) , quantum mechanics , composite material , physics
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