Open AccessMetastable defect response in CZTSSe from admittance spectroscopy
Author(s) -
Mark J. Koeper,
Charles J. Hages,
Jian V. Li,
Dean H. Levi,
Rakesh Agrawal
Publication year - 2017
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4996283
Subject(s) - metastability , admittance , capacitance , materials science , semiconductor , spectroscopy , trapping , charge carrier , optoelectronics , atomic physics , analytical chemistry (journal) , molecular physics , chemistry , physics , electrical impedance , electrode , ecology , organic chemistry , quantum mechanics , chromatography , biology
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