Open AccessSb-induced strain fluctuations in a strained layer superlattice of InAs/InAsSb
Author(s) -
Honggyu Kim,
Yifei Meng,
John F. Klem,
Samuel D. Hawkins,
Jin K. Kim,
Jian Zuo
Publication year - 2017
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4993673
Subject(s) - superlattice , strain (injury) , materials science , transmission electron microscopy , scanning tunneling microscope , condensed matter physics , scanning electron microscope , scanning transmission electron microscopy , layer (electronics) , crystallographic defect , quantum tunnelling , crystallography , chemistry , optoelectronics , nanotechnology , physics , composite material , medicine
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