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In-situ X-ray diffraction study of hydrogen absorption and desorption processes in Pd thin films: Hydrogen composition dependent anisotropic expansion and its quantitative description
Author(s) -
Takashi Harumoto,
Yusuke Ohnishi,
Keishi Nishio,
Takashi Ishiguro,
Ji Shi,
Yoshio Nakamura
Publication year - 2017
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4986214
Subject(s) - hydrogen , desorption , anisotropy , materials science , analytical chemistry (journal) , diffraction , thin film , palladium , absorption (acoustics) , x ray crystallography , chemistry , optics , nanotechnology , adsorption , composite material , catalysis , physics , biochemistry , organic chemistry , chromatography
The hydrogen absorption/desorption processes of (111)-textured and normal palladium (Pd) thin films of thickness ranging from 8 to 48 nm are investigated using X-ray diffractometry. The one-dimensional expansion of Pd lattice due to the substrate clamping is observed at the low hydrogen composition phase while both out-of-plane and in-plane expansions are detected at the high hydrogen composition phase. Accordingly, using a biaxial Poisson’s ratio, an anisotropic expansion factor is proposed for describing such phenomenon quantitatively and the hydrogen composition dependence on this factor is investigated

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