Open AccessAn improved method for determining carrier densities via drive level capacitance profiling
Author(s) -
Charles W. Warren,
Ellis T. Roe,
David Miller,
William N. Shafarman,
Mark C. Lonergan
Publication year - 2017
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4983367
Subject(s) - capacitance , profiling (computer programming) , amplitude , noise (video) , biological system , computer science , materials science , electronic engineering , computational physics , physics , optics , engineering , artificial intelligence , electrode , quantum mechanics , image (mathematics) , biology , operating system