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Impurity-induced deep centers in Tl6SI4
Author(s) -
Hongliang Shi,
Wenwen Lin,
Mercouri G. Kanatzidis,
Csaba Szeles,
MaoHua Du
Publication year - 2017
Publication title -
journal of applied physics
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4980174
Subject(s) - impurity , materials science , semiconductor , trapping , analytical chemistry (journal) , mass spectrometry , chemistry , optoelectronics , chromatography , ecology , organic chemistry , biology

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