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A comparison of point defects in Cd1−xZnxTe1−ySey crystals grown by Bridgman and traveling heater methods
Author(s) -
R. Gul,
Utpal Roy,
G. S. Camarda,
Anwar Hossain,
Ge Yang,
P. E. Vanier,
Vincenzo Lordi,
Joel B. Varley,
R. B. James
Publication year - 2017
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4979012
Subject(s) - czts , trapping , deep level transient spectroscopy , materials science , analytical chemistry (journal) , crystallographic defect , melting point , optoelectronics , chemistry , crystallography , band gap , silicon , ecology , chromatography , composite material , biology