Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay | Zendy

Zhiliang Gong | Zendy; Daniel H. Kerr | Zendy; Hyeondo Luke Hwang | Zendy; J. Michael Henderson | Zendy; Tiffany Suwatthee | Zendy; Benjamin R. Slaw | Zendy; Kathleen D. Cao | Zendy; Binhua Lin | Zendy; Wei Bu | Zendy; Ka Yee C. Lee | Zendy

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Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay

Author(s) -

Zhiliang Gong,

Daniel H. Kerr,

Hyeondo Luke Hwang,

J. Michael Henderson,

Tiffany Suwatthee,

Benjamin R. Slaw,

Kathleen D. Cao,

Binhua Lin,

Wei Bu,

Ka Yee C. Lee

Publication year - 2017

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.4978654

Subject(s) - monolayer , x ray fluorescence , reflection (computer programming) , ion , materials science , interface (matter) , fluorescence , analytical chemistry (journal) , total internal reflection , graphical user interface , pulmonary surfactant , dodecane , chemical engineering , nanotechnology , chemistry , computer science , optics , chromatography , physics , optoelectronics , nuclear chemistry , gibbs isotherm , organic chemistry , engineering , programming language

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