Open AccessCurrent-induced surface roughness reduction in conducting thin films
Author(s) -
Lin Du,
Dimitrios Maroudas
Publication year - 2017
Publication title -
applied physics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4977024
Subject(s) - materials science , thin film , surface roughness , electromigration , microelectronics , surface finish , residual stress , wetting , composite material , nanolithography , texture (cosmology) , nanotechnology , computer science , fabrication , medicine , alternative medicine , image (mathematics) , pathology , artificial intelligence
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