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Pyroelectric response in crystalline hafnium zirconium oxide (Hf1-xZrxO2) thin films
Author(s) -
Sean W. Smith,
Andrew R. Kitahara,
Mark A. Rodriguez,
Michael David Henry,
Michael T. Brumbach,
Jon Ihlefeld
Publication year - 2017
Publication title -
applied physics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4976519
Subject(s) - pyroelectricity , tetragonal crystal system , zirconium , materials science , hafnium , orthorhombic crystal system , analytical chemistry (journal) , polarization (electrochemistry) , oxide , thin film , zirconium alloy , crystal structure , dielectric , crystallography , chemistry , metallurgy , ferroelectricity , optoelectronics , nanotechnology , chromatography

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