Open AccessGrowth and characterization of TbAs films
Author(s) -
Cory C. Bomberger,
Bo E. Tew,
Matthew R. Lewis,
Joshua M. O. Zide
Publication year - 2016
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4967841
Subject(s) - molecular beam epitaxy , materials science , electron diffraction , band gap , reciprocal lattice , analytical chemistry (journal) , thin film , electron mobility , doping , reflection high energy electron diffraction , semiconductor , transmission electron microscopy , optics , optoelectronics , diffraction , epitaxy , chemistry , nanotechnology , physics , layer (electronics) , chromatography
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