Open AccessQuantifying point defects in Cu2ZnSn(S,Se)4 thin films using resonant x-ray diffraction
Author(s) -
Kevin H. Stone,
Steven T. Christensen,
Steven P. Harvey,
Glenn Teeter,
Ingrid Repins,
Michael F. Toney
Publication year - 2016
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4964738
Subject(s) - kesterite , diffraction , materials science , thin film , crystallography , crystallographic defect , x ray crystallography , rietveld refinement , czts , analytical chemistry (journal) , chemistry , nanotechnology , optics , physics , chromatography
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