Open AccessCathodoluminescence spectrum imaging analysis of CdTe thin-film bevels
Author(s) -
John Moseley,
Mowafak AlJassim,
Harvey Guthrey,
James M. Burst,
Joel N. Duenow,
R. K. Ahrenkiel,
Wyatt K. Metzger
Publication year - 2016
Publication title -
journal of applied physics
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4962286
Subject(s) - cathodoluminescence , materials science , grain boundary , cadmium telluride photovoltaics , exciton , grain size , molecular physics , analytical chemistry (journal) , condensed matter physics , optoelectronics , chemistry , luminescence , physics , composite material , microstructure , chromatography
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