Open AccessControl of secondary electrons from ion beam impact using a positive potential electrode
Author(s) -
T. P. Crowley,
D. R. Demers,
P. J. Fimognari
Publication year - 2016
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.4960170
Subject(s) - secondary electrons , electron , detector , electrode , ion , beam (structure) , ion beam , secondary emission , atomic physics , materials science , voltage , cathode ray , physics , signal (programming language) , optics , optoelectronics , nuclear physics , computer science , quantum mechanics , programming language
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