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Upgraded millimeter-wave interferometer for measuring the electron density during the beam extraction in the negative ion source
Author(s) -
T. Tokuzawa,
M. Kisaki,
K. Nagaoka,
K. Tsumori,
Y. Ito,
K. Ikeda,
H. Nakano,
M. Osakabe,
Y. Takeiri,
O. Kaneko
Publication year - 2016
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.4959841
Subject(s) - optics , interferometry , extremely high frequency , electron density , millimeter , wavelength , materials science , plasma , plasma diagnostics , cathode ray , physics , electron , quantum mechanics

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