Lattice damage and compositional changes in Xe ion irradiated InxGa1-xN (x = 0.32−1.0) single crystals
Author(s) -
Limin Zhang,
Weilin Jiang,
Amila Dissanayake,
Jinxin Peng,
Wensi Ai,
Jiandong Zhang,
Zihua Zhu,
Tieshan Wang,
V. Shutthanandan
Publication year - 2016
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4954691
Subject(s) - irradiation , ion , channelling , rutherford backscattering spectrometry , indium , materials science , analytical chemistry (journal) , fluence , xenon , lattice constant , chemistry , diffraction , optoelectronics , nuclear physics , physics , organic chemistry , chromatography , optics
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