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Alternative uses of a megavolt tandem accelerator for few-keV studies with ion-source SIMS monitoring
Author(s) -
S. L. A. Mello,
C. F. S. Codeço,
B. F. Magnani,
M. M. Sant’Anna
Publication year - 2016
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.4953889
Subject(s) - ion source , accelerator mass spectrometry , ion beam , ion , mass spectrometry , tandem accelerator , ion beam deposition , secondary ion mass spectrometry , materials science , range (aeronautics) , beam (structure) , ion gun , particle accelerator , irradiation , nuclear physics , atomic physics , physics , optics , quantum mechanics , composite material

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