Open AccessAn x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics
Author(s) -
M. P. Valdivia,
D. Stutman,
C. Stöeckl,
W. Theobald,
C. Mileham,
I. A. Begishev,
J. Bromage,
S. P. Regan
Publication year - 2016
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.4941441
Subject(s) - optics , laser , electron density , refraction , grating , materials science , backlight , plasma diagnostics , interferometry , electron , physics , phase contrast imaging , astronomical interferometer , talbot effect , plasma , phase contrast microscopy , quantum mechanics , liquid crystal display
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom