Wrinkling of extensional thin films through modified large deflection equations analytically and experimentally
Author(s) -
Ming Hwa R. Jen,
Ying Hui Wu
Publication year - 2015
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4939575
Subject(s) - thin film , orthotropic material , deflection (physics) , materials science , wrinkle , boundary value problem , amplitude , mechanics , composite material , mathematical analysis , physics , classical mechanics , mathematics , optics , thermodynamics , finite element method , nanotechnology
The stretch-induced wrinkling of thin films is solved through the modified von Kármán large deflection equations by first selecting the suitable deformation expressions that satisfy boundary conditions. Then, adopting the principle of minimum potential energy we obtain the deformations of simply supported rectangular thin films. The obtained significant deflections are nonlinearly elastic and of the lowest order of infinite solutions. The parameters of aspect ratio, the thickness and material of thin films are studied analytically and numerically. The highlighted results of wrinkle amplitude and load are in good agreement with experiments. The methodology also indicates the limit load impending plasticity and predicts the applied load precisely for each wrinkle. Further, it can be extended to the variety of multifunctional orthotropic and multi-layered thin films
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