Open AccessCharacterization of electrically-active defects in ultraviolet light-emitting diodes with laser-based failure analysis techniques
Author(s) -
Mary Ann Miller,
Paiboon Tangyunyong,
Edward I. Cole
Publication year - 2016
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4939305
Subject(s) - light emitting diode , materials science , diode , optoelectronics , ultraviolet , dislocation , leakage (economics) , laser , biasing , voltage , transmission electron microscopy , optics , nanotechnology , physics , quantum mechanics , economics , composite material , macroeconomics
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