Open AccessFull information acquisition in piezoresponse force microscopy
Author(s) -
Suhas Somnath,
Alex Belianinov,
Sergei V. Kalinin,
Stephen Jesse
Publication year - 2015
Publication title -
applied physics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4938482
Subject(s) - piezoresponse force microscopy , detector , cantilever , microscopy , scanning probe microscopy , materials science , mode (computer interface) , non contact atomic force microscopy , resonance (particle physics) , excitation , optics , nanotechnology , physics , optoelectronics , computer science , kelvin probe force microscope , ferroelectricity , atomic physics , quantum mechanics , dielectric , composite material , operating system
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