X-ray absorption spectroscopy of Mn doped ZnO thin films prepared by rf sputtering technique | Zendy

Ashok K. Yadav | Zendy; S. Maidul Haque | Zendy; D. K. Shukla | Zendy; R. J. Choudhary | Zendy; S. N. Jha | Zendy; D. Bhattacharyya | Zendy

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X-ray absorption spectroscopy of Mn doped ZnO thin films prepared by rf sputtering technique

Author(s) -

Ashok K. Yadav,

S. Maidul Haque,

D. K. Shukla,

R. J. Choudhary,

S. N. Jha,

D. Bhattacharyya

Publication year - 2015

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.4936398

Subject(s) - xanes , extended x ray absorption fine structure , materials science , analytical chemistry (journal) , doping , sputtering , spectroscopy , thin film , ferromagnetism , absorption (acoustics) , sputter deposition , absorption spectroscopy , magnetic semiconductor , optics , chemistry , optoelectronics , condensed matter physics , nanotechnology , physics , chromatography , quantum mechanics , composite material

A set of r.f. sputter deposited ZnO thin films prepared with different Mn doping concentrations have been characterised by Extended X-ray Absorption Fine Structure (EXAFS) and X-ray Absorption Near Edge Spectroscopy (XANES) measurements at Zn, Mn and O K edges and at Mn L2,3 edges apart from long range structural characterisation by Grazing Incident X-ray Diffraction (GIXRD) technique. Magnetic measurements show room temperature ferromagnetism in samples with lower Mn doping which is however, gets destroyed at higher Mn doping concentration. The results of the magnetic measurements have been explained using the local structure information obtained from EXAFS and XANES measurements

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