Open AccessOn the scaling of multicrystal data sets collected at high-intensity X-ray and electron sources
Author(s) -
Philip Coppens,
Bertrand Fournier
Publication year - 2015
Publication title -
structural dynamics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.415
H-Index - 29
ISSN - 2329-7778
DOI - 10.1063/1.4935526
Subject(s) - scaling , intensity (physics) , laser , electron , optics , physics , data set , x ray , computational physics , computer science , nuclear physics , mathematics , geometry , artificial intelligence
The need for data-scaling has become increasingly evident as time-resolved pump-probe photocrystallography is rapidly developing at high intensity X-ray sources. Several aspects of the scaling of data sets collected at synchrotrons, XFELs (X-ray Free Electron Lasers) and high-intensity pulsed electron sources are discussed. They include laser-ON/laser-OFF data scaling, inter- and intra-data set scaling