On the scaling of multicrystal data sets collected at high-intensity X-ray and electron sources | Zendy

Philip Coppens | Zendy; Bertrand Fournier | Zendy

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On the scaling of multicrystal data sets collected at high-intensity X-ray and electron sources

Author(s) -

Philip Coppens,

Bertrand Fournier

Publication year - 2015

Publication title -

structural dynamics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.415

H-Index - 29

ISSN - 2329-7778

DOI - 10.1063/1.4935526

Subject(s) - scaling , intensity (physics) , laser , electron , optics , physics , data set , x ray , computational physics , computer science , nuclear physics , mathematics , geometry , artificial intelligence

The need for data-scaling has become increasingly evident as time-resolved pump-probe photocrystallography is rapidly developing at high intensity X-ray sources. Several aspects of the scaling of data sets collected at synchrotrons, XFELs (X-ray Free Electron Lasers) and high-intensity pulsed electron sources are discussed. They include laser-ON/laser-OFF data scaling, inter- and intra-data set scaling

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