Open AccessLarge grain CBMM Nb ingot slices: An ideal test bed for exploring the microstructure-electromagnetic property relationships relevant to SRF
Author(s) -
Zuhawn Sung,
Peter J. Lee,
Anatolii Polyanskii,
S. Balachandran,
Santosh Chetri,
D. C. Larbalestier,
Mingmin Wang,
C. Compton,
Thomas R. Bieler
Publication year - 2015
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4935318
Subject(s) - ingot , materials science , niobium , grain boundary , electron backscatter diffraction , microstructure , grain size , transmission electron microscopy , penetration depth , composite material , metallurgy , optics , nanotechnology , physics , alloy
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