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Critical thickness of atomically ordered III-V alloys
Author(s) -
Ryan M. France,
William E. McMahon,
Harvey Guthrey
Publication year - 2015
Publication title -
applied physics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4933092
Subject(s) - cathodoluminescence , materials science , condensed matter physics , dislocation , curvature , wafer , lattice (music) , strain energy , relaxation (psychology) , elastic energy , nanotechnology , composite material , thermodynamics , optoelectronics , geometry , physics , psychology , social psychology , mathematics , finite element method , luminescence , acoustics

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