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Specularity of concentrator mirrors for CPV measured with VLABS
Author(s) -
Tobias Schmid,
Anna Heimsath,
Andreas Hornung,
Peter Nitz
Publication year - 2015
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4931541
Subject(s) - specular reflection , specularity , optics , reflectivity , materials science , scattering , diffuse reflection , acceptance angle , bidirectional reflectance distribution function , angular resolution (graph drawing) , remote sensing , physics , geology , mathematics , combinatorics
We investigate the specular reflectance properties of four different mirror samples suitable for massmanufacturing of CPV primary concentrators. The laboratory setup VLABS and its data evaluation procedure to calculate specular reflectance are introduced. We present measurement results of specular reflectance with a very high angular resolution around the specular direction making it possible to compare different mirror materials to a high degree of accuracy for arbitrary acceptance angles. It is shown that the specular reflectance can be significantly lower than hemispherical reflectance due to surface scattering. For a CPV system with 1° acceptance angle the loss of radiant flux due to surface scattering amounts to a maximum of 8% relative for the investigated samples

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