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Profiling the local carrier concentration across a semiconductor quantum dot
Author(s) -
Jenna Walrath,
Yen-Hsiang Lin,
Simon Huang,
R. S. Goldman
Publication year - 2015
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4919919
Subject(s) - quantum dot , materials science , dopant , epitaxy , trapping , optoelectronics , condensed matter physics , carrier lifetime , seebeck coefficient , layer (electronics) , nanotechnology , doping , physics , silicon , thermal conductivity , ecology , composite material , biology

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