Open AccessDetection and modeling of leakage current in AlGaN-based deep ultraviolet light-emitting diodes
Author(s) -
Michael W. Moseley,
Andrew A. Allerman,
Mary H. Crawford,
Jonathan J. Wierer,
Michael L. Smith,
Andrew Armstrong
Publication year - 2015
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4908543
Subject(s) - materials science , optoelectronics , light emitting diode , diode , wide bandgap semiconductor , leakage (economics) , ultraviolet , etching (microfabrication) , voltage , layer (electronics) , composite material , electrical engineering , economics , engineering , macroeconomics
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