z-logo
open-access-imgOpen Access
Influence of pulse poling on the piezoelectric property of Pb(Zr0.52,Ti0.48)O3 thin films
Author(s) -
Takeshi Kobayashi,
Y. Suzuki,
Natsumi Makimoto,
Hiroshi Funakubo,
Ryutaro Maeda
Publication year - 2014
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4901912
Subject(s) - poling , piezoelectricity , materials science , thin film , microelectromechanical systems , pulse (music) , composite material , pmut , displacement (psychology) , optoelectronics , nanotechnology , voltage , dielectric , ferroelectricity , electrical engineering , psychology , engineering , psychotherapist
We have investigated the influence of pulse poling on the piezoelectric property of Pb(Zr0.52,Ti0.48)O3 (PZT) thin films. 1.9-μm-thick PZT thin films were deposited by sol-gel method and fabricated into microelectromechanical systems (MEMS) based piezoelectric microcantilevers. 1 kHz of unipolar or bipolar triangle pulse wave between 30-100 V was applied to the PZT thin films. The effective piezoelectric constant d31, under small signal actuation at 1-3 Vpp, was estimated from the tip displacement of the piezoelectric microcantilevers. The highest piezoelectric constant |d31| as high as 105 pm/V has been obtained by downward unipolar pulse poling at 100 V

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom