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Method of choice for fabrication of high-quality ZnO-based Schottky diodes
Author(s) -
Stefan Müller,
Holger von Wenckstern,
Florian Schmidt,
Daniel Splith,
Robert Heinhold,
Martin Allen,
Marius Grundmann
Publication year - 2014
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4901637
Subject(s) - schottky diode , schottky barrier , rectification , materials science , homogeneity (statistics) , optoelectronics , fabrication , metal–semiconductor junction , pulsed laser deposition , diode , analytical chemistry (journal) , thin film , nanotechnology , chemistry , voltage , medicine , statistics , physics , alternative medicine , pathology , mathematics , quantum mechanics , chromatography

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