Impact of strain on electronic defects in (Mg,Zn)O thin films
Author(s) -
Florian Schmidt,
Stefan Müller,
Holger von Wenckstern,
Gabriele Benndorf,
R. Pickenhain,
Marius Grundmann
Publication year - 2014
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4894841
Subject(s) - photoluminescence , materials science , thin film , spectroscopy , strain (injury) , ultimate tensile strength , deep level transient spectroscopy , crystallographic defect , doping , tensile strain , analytical chemistry (journal) , diffraction , optoelectronics , crystallography , composite material , chemistry , optics , nanotechnology , silicon , physics , chromatography , quantum mechanics , medicine
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