z-logo
open-access-imgOpen Access
Impact of strain on electronic defects in (Mg,Zn)O thin films
Author(s) -
Florian Schmidt,
Stefan Müller,
Holger von Wenckstern,
Gabriele Benndorf,
R. Pickenhain,
Marius Grundmann
Publication year - 2014
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4894841
Subject(s) - photoluminescence , materials science , thin film , spectroscopy , strain (injury) , ultimate tensile strength , deep level transient spectroscopy , crystallographic defect , doping , tensile strain , analytical chemistry (journal) , diffraction , optoelectronics , crystallography , composite material , chemistry , optics , nanotechnology , silicon , physics , chromatography , quantum mechanics , medicine

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom