2D potential measurements by applying automatic beam adjustment system to heavy ion beam probe diagnostic on the Large Helical Device | Zendy

A. Shimizu | Zendy; T. Ido | Zendy; Megumi Kurachi | Zendy; R. Makino | Zendy; M. Nishiura | Zendy; Susumu Katō | Zendy; A. Nishizawa | Zendy; Y. Hamada | Zendy

Open Access

2D potential measurements by applying automatic beam adjustment system to heavy ion beam probe diagnostic on the Large Helical Device

Author(s) -

A. Shimizu,

T. Ido,

Megumi Kurachi,

R. Makino,

M. Nishiura,

Susumu Katō,

A. Nishizawa,

Y. Hamada

Publication year - 2014

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.4891975

Subject(s) - large helical device , beam (structure) , physics , ion beam , atomic physics , energy (signal processing) , ion , optics , plasma , nuclear physics , quantum mechanics

Two-dimensional potential profiles in the Large Helical Device (LHD) were measured with heavy ion beam probe (HIBP). To measure the two-dimensional profile, the probe beam energy has to be changed. However, this task is not easy, because the beam transport line of LHD-HIBP sys- tem is very long (?20 m), and the required beam adjustment consumes much time. To reduce the probe beam energy adjustment time, an automatic beam adjustment system has been developed. Us- ing this system, required time to change the probe beam energy is dramatically reduced, such that two-dimensional potential profiles were able to be successfully measured with HIBP by changing the probe beam energy shot to shot

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