Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy | Zendy

Hiroaki Ooe | Zendy; Tatsuya Sakuishi | Zendy; Makoto Nogami | Zendy; Masahiko Tomitori | Zendy; Toyoko Arai | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy

Author(s) -

Hiroaki Ooe,

Tatsuya Sakuishi,

Makoto Nogami,

Masahiko Tomitori,

Toyoko Arai

Publication year - 2014

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.4891882

Subject(s) - tuning fork , non contact atomic force microscopy , dissipation , resonance (particle physics) , resolution (logic) , q factor , atomic force acoustic microscopy , signal (programming language) , atomic force microscopy , chemistry , magnetic force microscope , conductive atomic force microscopy , analytical chemistry (journal) , materials science , optoelectronics , physics , atomic physics , acoustics , nanotechnology , magnetic field , vibration , magnetization , computer science , chromatography , resonator , quantum mechanics , thermodynamics , programming language , artificial intelligence

Based on a two-prong type quartz tuning fork, a force sensor with a high Q factor, which we call a retuned fork sensor, was developed for non-contact atomic force microscopy (nc-AFM) with atomic resolution. By cutting a small notch and attaching an AFM tip to one prong, its resonance frequency can be retuned to that of the other intact prong. In balancing the two prongs in this manner, a high Q factor (>50 000 in ultrahigh vacuum) is obtained for the sensor. An atomic resolution image of the Si(111)-7 × 7 surface was demonstrated using an nc-AFM with the sensor. The dependence of the Q factor on resonance frequency of the sensor and the long-range force between tip and sample were measured and analyzed in view of the various dissipation channels. Dissipation in the signal detection circuit turned out to be mainly limited by the total Q factor of the nc-AFM system

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research