Open AccessElectrical current leakage and open-core threading dislocations in AlGaN-based deep ultraviolet light-emitting diodes
Author(s) -
Michael W. Moseley,
Andrew A. Allerman,
Mary H. Crawford,
Jonathan J. Wierer,
M Smith,
Laura Biedermann
Publication year - 2014
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4891830
Subject(s) - materials science , light emitting diode , optoelectronics , diode , threading (protein sequence) , ultraviolet , dislocation , wide bandgap semiconductor , leakage (economics) , composite material , physics , nuclear magnetic resonance , protein structure , economics , macroeconomics
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