Field emission behavior of carbon nanotube field emitters after high temperature thermal annealing | Zendy

Yuning Sun | Zendy; Dong Hoon Shin | Zendy; Ki Nam Yun | Zendy; Yeon Mo Hwang | Zendy; Yenan Song | Zendy; Guillaume Leti | Zendy; Seok-Gy Jeon | Zendy; Jung-Il Kim | Zendy; Yahachi Saito | Zendy; Cheol Jin Lee | Zendy

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Field emission behavior of carbon nanotube field emitters after high temperature thermal annealing

Author(s) -

Yuning Sun,

Dong Hoon Shin,

Ki Nam Yun,

Yeon Mo Hwang,

Yenan Song,

Guillaume Leti,

Seok-Gy Jeon,

Jung-Il Kim,

Yahachi Saito,

Cheol Jin Lee

Publication year - 2014

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.4889896

Subject(s) - field electron emission , materials science , carbon nanotube , electric field , graphite , annealing (glass) , common emitter , current density , crystallinity , thermal stability , optoelectronics , composite material , nanotechnology , electron , chemistry , physics , organic chemistry , quantum mechanics

The carbon nanotube (CNT) field emitters have been fabricated by attaching a CNT film on a graphite rod using graphite adhesive material. The CNT field emitters showed much improved field emission properties due to increasing crystallinity and decreasing defects in CNTs after the high temperature thermal annealing at 900 °C in vacuum ambient. The CNT field emitters showed the low turn-on electric field of 1.15 V/μm, the low threshold electric field of 1.62 V/μm, and the high emission current of 5.9 mA which corresponds to a current density of 8.5 A/cm2. In addition, the CNT field emitters indicated the enhanced field emission properties due to the multi-stage effect when the length of the graphite rod increases. The CNT field emitter showed good field emission stability after the high temperature thermal annealing. The CNT field emitter revealed a focused electron beam spot without any focusing electrodes and also showed good field emission repeatability

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